Optimization and Analysis Techniques for the Deep Submicron Regime
نویسندگان
چکیده
Scaling in the deep submicron (DSM) regime has fundamentally altered the primary issues affecting VLSI design. The emergence of DSM-related problems has resulted in a proliferation of design techniques that attempt to alleviate these newer effects in current flows. However, future design methodologies would be required to undergo a paradigm shift to comprehensively address these problems. A few of these newer problems are listed below:
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تاریخ انتشار 2001